67 GHz Differential RF Probe for On-Wafer and PCB Characterization VST-67G-GSGSG
P/N: VST-67G-GSGSG-XXX
- For differential PCB and wafer-level testing
- GSGSG geometry for cleaner mixed-mode measurements
- Interleaved grounds help minimize crosstalk
- Well suited to 112G PAM4 and 5G/6G validation
- Supports differential measurements through 67 GHz
Engineering Note
The VST-67G-GSGSG is a precision 67 GHz differential RF probe designed for on-wafer characterization and high-frequency PCB validation. Its 100 Ω GSGSG tip structure supports controlled differential measurements with low crosstalk and stable signal integrity. With a 45-degree 1.85 mm female interface and configurable pitch options from 100 μm to 1250 μm, this probe is well suited for SerDes evaluation, RFIC/MMIC development, and broadband differential signal integrity analysis.
Technical Specifications
Target Applications
On-Wafer Differential Characterization
Designed for broadband differential probing in wafer-level test environments where stable contact and controlled signal paths are required.
High-Frequency PCB Validation
Suitable for differential PCB and interconnect verification in high-speed digital, RF, and microwave test setups.
SerDes and Signal Integrity Analysis
Supports differential channel evaluation, eye-diagram analysis, and signal integrity measurements in high-speed data applications.
RFIC and MMIC Development
Well suited for differential RFIC, MMIC, and microwave device evaluation where bandwidth, repeatability, and contact stability are critical.
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