110 GHz Differential RF Probe for On-Wafer and PCB Validation VST-110G-GSSG
P/N: VST-110G-GSSG-XXX
- For differential PCB and wafer-level measurements
- GSSG geometry for cleaner mixed-mode characterization
- Precision tip symmetry for repeatable high-frequency contact
- Well suited to 6G, radar, and high-speed SerDes evaluation
- Supports differential applications through 110 GHz
Engineering Note
VST-110G-GSSG-XXX is a DC–110 GHz GSSG RF probe for on-wafer measurement of high-frequency differential circuits. It uses a GSSG tip configuration, 1.00mm female interface, and 45-degree connector angle, with pitch options from 40 μm to 3 mm. This configuration is intended for wafer-level characterization where stable contact, wide bandwidth, and differential probing capability are required. :contentReference
Technical Specifications
Target Applications
RF Wafer Test
Intended for wafer-level RF measurements where stable differential probing is required across wide frequency range. :contentReference
Signal Integrity and Calibration
Suitable for signal integrity testing, calibration, and mixed high-frequency measurement setups using probe stations. :contentReference
Coplanar and Semiconductor Testing
Used for coplanar waveguide circuit testing and semiconductor production measurement up to 110 GHz and beyond. :contentReference
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