67 GHz GSG RF Probe for On-Wafer and PCB Characterization VST-67G-GSG
P/N: VST-67G-GSG-XXX
- For single-ended PCB and wafer-level testing
- GSG geometry for clean coplanar probing
- Fine-pitch tips for dense pad layouts
- Well suited to mmWave and high-speed device validation
- Supports precision measurements through 67 GHz
Engineering Note
VST-67G-GSG is a high-precision DC–67 GHz GSG RF probe for on-wafer measurement and high-frequency PCB characterization. Its GSG tip configuration supports controlled single-ended probing with stable impedance and low reflection, making it suitable for mmWave device evaluation, high-speed interconnect analysis, and advanced semiconductor test environments.
Technical Specifications
Target Applications
Wafer-Level mmWave Testing
Suitable for 5G / 6G and other mmWave device measurements where precise on-wafer contact and repeatability are required.
IC, MMIC and Interconnect Evaluation
Appropriate for 67 GHz IC and MMIC characterization, high-speed digital interconnect evaluation, and RF front-end verification.
Failure Analysis and Engineering Debug
Useful for advanced engineering debug and lab validation where low loss, high return loss, and stable contact resistance are important.
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