40 GHz GSG RF Probe for On-Wafer and PCB Characterization VST-40G-GSG
P/N: VST-40G-GSG-XXX
- For single-ended PCB and wafer-level testing
- GSG geometry for clean coplanar probing
- Fine-pitch tips for dense pad layouts
- Well suited to SI and high-speed device validation
- Supports precision measurements through 40 GHz
Engineering Note
VST-40G-GSG is a precision DC–40 GHz GSG RF probe for on-wafer measurements and high-frequency PCB characterization. Its GSG tip configuration supports controlled single-ended probing with stable impedance, low parasitics, and excellent repeatability across a wide range of semiconductor and RF test environments. With a 2.92 mm female connector, 45-degree connector angle, and 100 μm to 1250 μm pitch range, this probe is well suited to RF / microwave device testing, IC and MMIC characterization, interconnect evaluation, and engineering debug.
Technical Specifications
Target Applications
Wafer-Level RF and Microwave Testing
Suitable for wafer-level RF and microwave device testing where stable probe contact and repeatable measurements are required.
IC, MMIC and Interconnect Evaluation
Appropriate for IC and MMIC characterization, PA/LNA evaluation, and high-frequency interconnect or connector validation.
Research and Engineering Debug
Useful for failure analysis, engineering debug, academic research, and advanced quantum system development.
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