40 GHz Differential RF Probe for On-Wafer and PCB Characterization VST-40G-GSSG
P/N: VST-40G-GSSG-XXX
- For differential PCB and wafer-level testing
- GSSG geometry for cleaner mixed-mode measurements
- Tight symmetry for low-skew signal capture
- Well suited to high-speed serial and SI evaluation
- Supports differential applications through 40 GHz
Engineering Note
VST-40G-GSSG is a DC–40 GHz GSSG RF probe for differential on-wafer measurement. It uses a GSSG tip configuration, 2.92mm female interface, and 45-degree connector angle, with standard pitch coverage from 100 μm to 1250 μm. This configuration is intended for wafer-level differential measurements where low loss, stable contact, and repeatable high-frequency probing are required.
Technical Specifications
Target Applications
Differential IC and MMIC Characterization
Intended for balanced circuit evaluation where differential probing and repeatable wafer contact are required.
High-Speed Serial Link Evaluation
Suitable for high-speed interconnect validation, including USB 3.x and PCIe 4.0 differential measurements.
Signal Integrity and Differential RF Research
Used for SI analysis, balanced amplifier and mixer testing, and advanced probe-station measurements on coplanar structures.
Engineering Support
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Product selection support
Custom configurations available
Specification and compatibility review