VST-110G-GSGSG-XXX DC to 110GHz GSGSG RF probe for wafer-level sub-THz and high-speed signal testing

110 GHz Differential RF Probe for On-Wafer and PCB Characterization VST-110G-GSGSG

P/N: VST-110G-GSGSG-XXX

  • For differential PCB and wafer-level testing
  • GSGSG geometry for cleaner mixed-mode measurements
  • Interleaved grounds for superior isolation
  • Well suited to 224G SerDes and 6G sub-THz validation
  • Supports differential measurements through 110 GHz
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Engineering Note
The VST-110G-GSGSG is a precision 110 GHz differential RF probe developed for on-wafer characterization and high-frequency PCB validation. Its GSGSG tip configuration provides a controlled differential probing structure with interleaved ground shielding to reduce crosstalk and support stable signal integrity analysis at sub-THz frequencies. Equipped with a 45-degree 1.0 mm female interface and configurable pitch options from 100 μm to 1250 μm, this probe is well suited for advanced SerDes evaluation, RFIC/MMIC development, differential channel analysis, and next-generation high-speed test environments.

Technical Specifications

Part Number VST-110G-GSGSG-XXX
Product Type Differential RF Probe
Frequency Range DC–110 GHz
Tip Configuration GSGSG
Characteristic Impedance 100 Ω
Insertion Loss < 3.5 dB
Return Loss > 10 dB
Connector Interface 1.0 mm Female
Connector Angle 45-degree
Pitch Range 100 μm–1250 μm or customized
Standard Pitch Step 50 μm
Tip Size 25 μm for 100–250 μm pitch; 50 μm for 300–1250 μm pitch
DC Current ≤ 1 A
DC Voltage ≤ 100 V
RF Power ≤ 5 W
Model Format VST-110G-GSGSG-XXX
Ordering Note XXX = pad pitch in microns

Target Applications

On-Wafer Differential Characterization
Suitable for wafer-level probing of high-speed differential structures where bandwidth, repeatability, and stable contact are critical.
High-Frequency PCB Validation
Supports PCB differential test and interconnect evaluation in advanced microwave, mmWave, and sub-THz validation environments.
SerDes and Signal Integrity Analysis
Well suited for high-speed differential channel analysis, including next-generation SerDes, PAM4, and advanced signal integrity measurements.
RFIC MMIC and 6G Device Development
Applicable to RFIC, MMIC, transceiver, and emerging 6G device evaluation where controlled differential probing at very high frequencies is required.

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