110 GHz GSG RF Probe for On-Wafer and PCB Characterization VST-110G-GSG

Engineering Note

VST-110G-GSG is a precision DC–110 GHz GSG RF probe designed for on-wafer measurements and high-frequency PCB characterization. Its GSG tip configuration supports stable single-ended probing with controlled impedance, making it suitable for W-band and mmWave test environments where measurement consistency is critical. With a 1.00 mm female connector, 45-degree connector angle, and 100 μm to 1250 μm pitch range, this probe is well suited to advanced RF, microwave, and millimeter-wave evaluation platforms, including semiconductor, photonic, radar, and cryogenic test applications.

Part Number	VST-110G-GSG-XXX
Product Type	GSG RF Probe
Frequency Range	DC–110 GHz
Insertion Loss	< 2.2 dB
Return Loss	> 12 dB
Impedance	50 Ω
DC Current	≤ 1 A
DC Voltage	≤ 100 V
RF Power	≤ 5 W
Connector	1.00 mm Female
Tip Configuration	GSG
Connector Angle	45-degree
Pitch Range	100 μm–1250 μm or customized
Standard Pitch Step	50 μm
Tip Size	25 μm for 100–250 μm pitch; 50 μm for 300–1250 μm pitch