40 GHz Differential RF Probe for On-Wafer and PCB Characterization VST-40G-GSGSG
P/N: VST-40G-GSGSG-XXX
- For differential PCB and wafer-level testing
- GSGSG geometry for cleaner mixed-mode measurements
- Interleaved grounds help reduce crosstalk
- Well suited to SerDes and SI validation
- Supports differential measurements through 40 GHz
Engineering Note
The VST-40G-GSGSG is a precision 40 GHz differential RF probe for on-wafer characterization and high-frequency PCB validation. Its GSGSG tip structure supports 100 Ω differential measurements with reduced crosstalk and stable signal integrity. A 45-degree 2.92 mm female interface and configurable pitch options from 100 μm to 1250 μm make it suitable for SerDes evaluation, RFIC/MMIC development, and wafer-level differential testing.
Technical Specifications
Target Applications
On-Wafer Differential Characterization
Suitable for broadband differential measurements on wafer, including device evaluation, design verification, and production-level probe testing.
High-Speed PCB Validation
Supports high-frequency PCB characterization where controlled differential probing and stable contact geometry are required.
SerDes and Signal Integrity Analysis
Well suited for differential channel evaluation, SerDes testing, and signal integrity analysis in high-speed digital and mixed-signal environments.
Differential RFIC and MMIC Evaluation
Used for RFIC and MMIC development where low crosstalk, reliable contact, and accurate 100 Ω differential measurement are essential.
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