67 GHz GS RF Probe for On-Wafer and PCB Characterization VST-67G-GS
P/N: VST-67G-GS-XXX
- For single-ended PCB and wafer-level testing
- GS geometry for clean ground-signal probing
- Fine-pitch tips for dense pad layouts
- Well suited to mmWave device and SI validation
- Supports precision measurements through 67 GHz
Engineering Note
VST-67G-GS is a DC–67 GHz GS RF probe for single-ended on-wafer measurement and high-frequency PCB characterization. It uses a GS tip configuration, a 1.85 mm female connector, and a 45-degree connector angle. The datasheet gives a standard 100 μm to 1250 μm pitch range with custom options available, making it suitable for mmWave device characterization, coplanar structure testing, and compact high-frequency validation setups.
Technical Specifications
Target Applications
Wafer-Level mmWave Characterization
Suitable for 5G/6G and other mmWave device measurements where single-ended probing is required.
High-Speed Serial and SI Evaluation
Appropriate for signal-integrity studies and high-speed digital link evaluation on fine-pitch structures.
PCB and Research Validation
Useful for compact PCB launches, coplanar waveguide testing, and advanced academic or quantum research platforms.
Related products
-
145 GHz GSSG Differential RF Probe, 100 Ω, 0.8 mm Female | VST-145G-GSSG-XXX
-
145 GHz GSGSG Differential RF Probe, 100 Ω, 0.8 mm Female | VST-145G-GSGSG-XXX
-
DC–40 GHz GS RF Probe for Wafer-Level RF Testing VST-40G-GS-XXX
-
110 GHz Differential RF Probe for On-Wafer and PCB Characterization VST-110G-GSGSG
Engineering Support
Need a Quote or Technical Support?
Share the part number, required quantity and application requirements. Our engineering team can assist with product selection, configuration review and quotation support.
Product selection support
Custom configurations available
Specification and compatibility review