67 GHz Differential RF Probe for On-Wafer and PCB Validation VST-67G-GSSG
P/N: VST-67G-GSSG-XXX
- For differential PCB and wafer-level testing
- GSSG geometry for cleaner mixed-mode measurements
- Tight phase matching for low-skew signal capture
- Well suited to 112G SerDes and 5G/6G evaluation
- Supports differential applications through 67 GHz
Engineering Note
VST-67G-GSSG is a DC–67 GHz GSSG RF probe for differential on-wafer measurement. It uses a GSSG tip configuration, 1.85mm female interface, and 45-degree connector angle, with standard pitch coverage from 100 μm to 1250 μm. This configuration is intended for wafer-level differential measurements where low loss, stable contact, and repeatable high-frequency probing are required.
Technical Specifications
Target Applications
112G SerDes and PAM4 Testing
Intended for high-speed differential measurements where low loss and tight phase consistency are required.
5G and 6G Differential Characterization
Suitable for mmWave differential component and circuit evaluation on wafer and probe-station setups.
High-Speed Logic and Advanced Research
Used for transceiver evaluation and advanced research platforms including quantum and high-speed logic studies.
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