145 GHz GSSG Differential RF Probe, 100 Ω, 0.8 mm Female | VST-145G-GSSG-XXX
P/N: VST-145G-GSSG-XXX
• DC–145 GHz GSSG probing for differential and mixed-mode characterization
• 100 ±2 Ω differential impedance with <3.5 dB insertion loss and >10 dB return loss
• Compact G-S-S-G contact geometry for closely spaced differential signal pads
• Configurable 100–1250 μm pitch with 0.8 mm female RF interface
• S4P characterization data available to support four-port de-embedding and mixed-mode analysis
VST-145G-GSSG-XXX is a 100 Ω Ground-Signal-Signal-Ground differential RF probe for high-frequency differential and mixed-mode characterization from DC to 145 GHz. Its GSSG contact geometry places the two signal contacts adjacent to each other, with ground contacts on the outside, supporting direct access to closely spaced differential pad structures.
The probe is specified for 100 ±2 Ω differential impedance, insertion loss <3.5 dB, and return loss >10 dB through 145 GHz. Configurable pitch from 100 μm to 1250 μm supports differential RF devices, wafers, packages, interconnects, RFICs, MMICs, and high-frequency test structures.
DC–145 GHz Differential Probing
GSSG architecture supports differential and mixed-mode characterization across microwave, millimeter-wave, and D-band frequencies.
100 ±2 Ω Differential Impedance
Controlled differential impedance supports the transition from the coaxial RF interfaces to the GSSG probe-tip structure.
<3.5 dB Insertion Loss
Specified insertion loss below 3.5 dB across DC–145 GHz, with return loss greater than 10 dB.
Compact GSSG Contact Geometry
Adjacent signal contacts with outer ground references support direct probing of closely spaced differential signal pads.
Configurable 100–1250 μm Pitch
Pitch options are available in 25 μm steps from 100–250 μm and 50 μm steps from 300–1250 μm.
S4P Support for De-Embedding
Four-port S-parameter characterization data can be supplied to support differential, mixed-mode, and de-embedding workflows.
The GSSG arrangement is suited to differential layouts where the two signal pads are directly adjacent and ground pads are located outside the pair. Compared with an interleaved-ground GSGSG structure, GSSG preserves direct signal-to-signal adjacency at the probe tip.
The datasheet includes typical SDD21 and SDD11 performance for a 100 μm pitch configuration, illustrating the intended differential and mixed-mode characterization workflow through 145 GHz.
| Part Number | VST-145G-GSSG-XXX |
|---|---|
| Frequency Range | DC–145 GHz |
| Tip Configuration | GSSG (Ground-Signal-Signal-Ground) |
| Measurement Mode | Differential / Mixed-Mode |
| Differential Impedance | 100 ±2 Ω |
| Insertion Loss | <3.5 dB |
| Return Loss | >10 dB |
| DC Current | ≤1 A |
| DC Voltage | ≤100 V |
| RF Power | ≤5 W |
| RF Connector | 0.8 mm Female |
|---|---|
| Connector Angle | 45° |
| Pitch Range | 100–1250 μm |
| Pitch Step, 100–250 μm | 25 μm |
| Pitch Step, 300–1250 μm | 50 μm |
| Mechanical Envelope | Approx. 43.0 mm body length × 30.0 mm body width, per datasheet outline |
For differential measurements, establish the measurement reference plane at the probe-tip interface using a calibration substrate and method compatible with the selected pitch and four-port measurement setup. The datasheet lists SOLT / LRM-compatible calibration substrates as recommended accessories.
S4P characterization data can be used with the VNA or analysis software to support four-port de-embedding and mixed-mode conversion. Calibration, reference-plane definition, and de-embedding should be applied according to the instrument configuration and DUT topology used in the measurement system.
Differential & Mixed-Mode S-Parameters
Four-port differential characterization of compatible devices, interconnects, and test structures through 145 GHz.
High-Speed Differential Interconnects
Measurement of closely spaced differential transmission lines, package transitions, test coupons, and related high-speed structures.
RFIC / MMIC & Transceiver Test
Differential probing of high-frequency integrated devices, front-end structures, and transceiver-related test vehicles.
D-Band & Sub-THz R&D
Differential device and interconnect characterization for emerging high-frequency communications, sensing, and related D-band research.
Model Format
VST-145G-GSSG-[Pitch]
Example: a 100 μm pitch configuration is ordered as VST-145G-GSSG-100.
Pitch Selection
Select the nominal pitch to match the DUT differential pad geometry. Supported range: 100–1250 μm. Confirm the actual G-S-S-G pad arrangement before ordering.
Avoid excessive contact force, keep the probe tips and DUT contact surfaces clean, and store the probe in a protective case when not in use. For GSSG probing, verify simultaneous contact across both signal pads and both outer grounds, and confirm probe-tip alignment before calibration and measurement.
Need a 145 GHz GSSG probe matched to your differential pad layout?
Share your target pitch, GSSG pad geometry, DUT type, probe-station configuration, and mixed-mode measurement requirements. Our engineering team can review the probe configuration before quotation.
Related products
-
145 GHz GSG RF Probe, 0.8 mm Female, 100–1250 μm Pitch | VST-145G-GSG-XXX
-
DC–40 GHz Configurable-Pitch SS Differential RF Probe VST-D40G-SS-XXX
-
110 GHz Differential RF Probe for On-Wafer and PCB Characterization VST-110G-GSGSG
-
67 GHz Differential RF Probe for On-Wafer and PCB Characterization VST-67G-GSGSG
Need a Quote or Technical Support?
Share the part number, required quantity and application requirements. Our engineering team can assist with product selection, configuration review and quotation support.