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AQUILA™ Series Precision Probes
Microwave & mmWave Wafer Characterization (DC–110 GHz)
The AQUILA™ Series is a high-precision Cantilever RF Probe family featuring ultra-fine 10µm tips and anti-accumulation plating, engineered for mmWave characterization on delicate pads.
Why AQUILA™?
Engineered with specific material science advantages for semiconductor testing.
Anti-Gold Build-up
Advanced tip plating technology minimizes gold accumulation, ensuring consistent contact resistance (Cres) over thousands of touchdowns.
40µm Custom Pitch
Beyond the standard 50-1250µm range, we offer custom pitch down to 40µm for next-gen high-density wafer layouts.
Small Pad Access
The 10µm tip radius enables safe probing of pads as small as 30x30µm, ideal for silicon photonics and RFIC pads.
Al Pad Optimized
Controlled cantilever scrub effectively breaks aluminum oxide without creating deep probe marks or debris.
Technical Specifications
| Frequency Bands |
DC to 110 GHz Microwave (40G) • mmWave (67G / 110G) |
|---|---|
| Configuration | |
| Tip Tech |
|
| Pitch Range |
Standard: 50 - 1250 µm Custom: Down to 40 µm |
| Compatibility | Gold (Au), Aluminum (Al), Copper (Cu) Pads |
Ordering Information
Configure your part number.
VST - [Freq] - [Config] - [Pitch] - LF
Example: VST-110G-GSG-100-LF (110GHz, GSG, 100µm)
* Standard configurations typically ship within 7 days.
Frequency
- 40G DC-40 GHz
- 67G DC-67 GHz
- 110G DC-110 GHz
Configuration
- GS / SG Single-Ended
- GSG Standard
- GSSG Differential
Pitch (µm)
Standard increments of 25/50µm.
Advanced Research Solutions
Vinstronics offers specialized configurations for non-standard testing environments.
Precision Matters.
Ready to upgrade your wafer characterization setup? Standard probes ship in 7 days.
