Home » Applications » Semiconductor & PCB Testing
Applications / Semiconductor RF Measurement
Semiconductor Testing
Precision RF contact for wafers, devices and PCB test structures.
From on-wafer characterization to board-level probing, accurate measurements depend on suitable contact geometry, controlled positioning and reliable microwave connections. Vinstronics supplies the probes and supporting test hardware for these environments.
Measurement environments
Where direct RF probing matters
Different DUT formats create different contact and access challenges.
Wafer-Level
Direct contact with on-wafer RF structures supports S-parameter characterization and device-level measurements before packaging.
Device & Package
RF test structures and accessible device or package pads allow probing of microwave components and high-frequency interconnect transitions.
PCB & PCBA
Single-ended and differential probes provide temporary electrical access to test pads where a conventional coaxial connector is impractical.
Primary solution / RF Probes
RF probing at the measurement point
Vinstronics RF probes provide direct contact with wafer, device and PCB test pads. GS/SG, GSG, GSSG/GSGSG and SS configurations support different pad geometries and measurement requirements.
GS / SG
Single-ended access to compact ground–signal pad layouts.
GSG
Ground–signal–ground contact for coplanar RF structures.
GSSG / GSGSG
Ground-referenced contacts for differential and mixed-mode measurements.
SS Differential
Two-signal contact for PCB differential pads without a local ground pad.
Supporting test setup
Beyond the probe tip
Probe stations support the DUT; positioners control probe placement; microwave test cables connect the probing setup to the measurement instrument.
Probe Stations
Provide wafer and device positioning, sample support and microscope-based access for probe measurements.
Explore Series
Probe Positioners
Provide controlled mechanical adjustment and stable probe placement on small test pads.
Explore Series
Armored RF Test Cables
Provide mechanically protected RF connections between test instruments, probe interfaces and fixtures.
Explore SeriesApplication engineering
Discuss Your RF Probing Application
Contact Vinstronics about RF probes, positioning hardware and microwave connections for wafer, device or PCB measurements.
