40 GHz Economy RF Precision Test Cable J40

P/N: J40

  • For high-volume ATE test systems
  • PUR jacket resists production-line wear
  • Linear phase supports fast compensation
  • Flexible construction for frequent handling
  • Rated to 40 GHz for test links
Engineering Note
The J40 is a 40 GHz economy precision test cable designed for automated test equipment, high-volume production lines, and repeatable microwave component verification. Its construction uses a silver-plated copper inner conductor, low density PTFE dielectric, silver-plated copper strip inner shield, PFA interlayer, silver-plated copper wire braiding, and a blue PUR wear-resistant jacket. The cable supports frequent test-system handling while providing 83% velocity of propagation, >90 dB shielding effectiveness, and ±0.3°/GHz mechanical stationary phase for cost-effective 40 GHz test links.

Technical Specifications

Cable Name J40
Product Type Economy Precision Test Cable
Cable Structure Flexible precision test cable with PUR jacket
Operating Frequency 40 GHz
Cut-off Frequency 46 GHz
Impedance 50 ± 1 Ω
Velocity of Propagation 83%
Shielding Effectiveness >90 dB
Dielectric Withstanding Voltage 100 V.DC
Mechanical Stationary Phase ±0.3°/GHz
Static Bending Radius 20 mm [0.787 in]
Dynamic Bending Radius 40 mm [1.575 in]
Weight 0.037 kg/m [0.0249 lbs/ft]
Temperature Range -55 ~ +85 ℃ [-67 ~ +185 ℉]
Inner Conductor Silver-plated copper, 0.83 mm [0.033 in]
Dielectric Low density PTFE, 2.42 mm [0.095 in]
Inner Shield Silver-plated copper strip, 2.55 mm [0.100 in]
Interlayer PFA, 2.85 mm [0.112 in]
Outer Shield Silver-plated copper wire braiding, 3.42 mm [0.135 in]
Jacket PUR / Blue, customizable, 3.95 mm [0.156 in]
Attenuation 37.9 dB/100m @1 GHz; 124.5 dB/100m @10 GHz; 170.3 dB/100m @18 GHz; 263.1 dB/100m @40 GHz
Average Power 0.173 kW @1 GHz; 0.053 kW @10 GHz; 0.038 kW @18 GHz; 0.025 kW @40 GHz

Target Applications

High-Volume Production Testing
Suitable for production-line RF testing where cable wear resistance, repeatable handling, and cost control are important.
Automated Test Equipment
Supports ATE platforms that require flexible test interconnects with dynamic bending capability and predictable phase behavior.
40 GHz Component Verification
Used for economical microwave component verification, system connection, and complex test bench routing up to 40 GHz.
System Integration Test Benches
Suitable for complex RF test benches where flexible routing, repeatable connection, and economical 40 GHz test links are required.
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